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Make the fallback behavior of mbedtls_test_rnd_buffer_rand optional

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If a fallback is not explicitly configured in the
mbedtls_test_rnd_buf_info structure, fail after the buffer is
exhausted.

There is no intended behavior change in this commit: all existing uses
of mbedtls_test_rnd_buffer_rand() have been updated to set
mbedtls_test_rnd_std_rand as the fallback.

Signed-off-by: Gilles Peskine <Gilles.Peskine@arm.com>
This commit is contained in:
Gilles Peskine 2021-03-24 00:48:57 +01:00
parent 0b1b0abe33
commit ecacc3c9d2
6 changed files with 37 additions and 4 deletions
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9
tests/include/test/random.h
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@ -36,8 +36,11 @@
typedef struct
{
unsigned char *buf;
unsigned char *buf; /* Pointer to a buffer of length bytes. */
size_t length;
/* If fallback_f_rng is NULL, fail after delivering length bytes. */
int ( *fallback_f_rng )( void*, unsigned char *, size_t );
void *fallback_p_rng;
} mbedtls_test_rnd_buf_info;
/**
@ -84,7 +87,9 @@ int mbedtls_test_rnd_zero_rand( void *rng_state,
* the random function is specified by per_call. (Can be between
* 1 and 4)
*
* After the buffer is empty it will return mbedtls_test_rnd_std_rand().
* After the buffer is empty, this function will call the fallback RNG in the
* #mbedtls_test_rnd_buf_info structure if there is one, and
* will return #MBEDTLS_ERR_ENTROPY_SOURCE_FAILED otherwise.
*/
int mbedtls_test_rnd_buffer_rand( void *rng_state,
unsigned char *output,