SDL/test/testautomation_guid.c
Sam Lantinga 4f55271571 Removed temporary memory from the API
It was intended to make the API easier to use, but various automatic garbage collection all had flaws, and making the application periodically clean up temporary memory added cognitive load to using the API, and in many cases was it was difficult to restructure threaded code to handle this.

So, we're largely going back to the original system, where the API returns allocated results and you free them.

In addition, to solve the problems we originally wanted temporary memory for:
* Short strings with a finite count, like device names, get stored in a per-thread string pool.
* Events continue to use temporary memory internally, which is cleaned up on the next event processing cycle.
2024-07-26 20:59:14 -07:00

146 lines
3.3 KiB
C

/**
* GUID test suite
*/
#include <SDL3/SDL.h>
#include <SDL3/SDL_test.h>
#include "testautomation_suites.h"
#ifdef HAVE_STDINT_H
#include <stdint.h>
#endif
/* ================= Test Case Implementation ================== */
/* Helper functions */
#define NUM_TEST_GUIDS 5
#ifndef UINT64_C
#ifdef _MSC_VER
#define UINT64_C(x) x##ui64
#elif defined(_LP64)
#define UINT64_C(x) x##UL
#else
#define UINT64_C(x) x##ULL
#endif
#endif
static struct
{
char *str;
Uint64 upper, lower;
} test_guids[NUM_TEST_GUIDS] = {
{ "0000000000000000"
"ffffffffffffffff",
UINT64_C(0x0000000000000000), UINT64_C(0xffffffffffffffff) },
{ "0011223344556677"
"8091a2b3c4d5e6f0",
UINT64_C(0x0011223344556677), UINT64_C(0x8091a2b3c4d5e6f0) },
{ "a011223344556677"
"8091a2b3c4d5e6f0",
UINT64_C(0xa011223344556677), UINT64_C(0x8091a2b3c4d5e6f0) },
{ "a011223344556677"
"8091a2b3c4d5e6f1",
UINT64_C(0xa011223344556677), UINT64_C(0x8091a2b3c4d5e6f1) },
{ "a011223344556677"
"8191a2b3c4d5e6f0",
UINT64_C(0xa011223344556677), UINT64_C(0x8191a2b3c4d5e6f0) },
};
static void
upper_lower_to_bytestring(Uint8 *out, Uint64 upper, Uint64 lower)
{
Uint64 values[2];
int i, k;
values[0] = upper;
values[1] = lower;
for (i = 0; i < 2; ++i) {
Uint64 v = values[i];
for (k = 0; k < 8; ++k) {
*out++ = v >> 56;
v <<= 8;
}
}
}
/* Test case functions */
/**
* Check String-to-GUID conversion
*
* \sa SDL_StringToGUID
*/
static int
TestStringToGUID(void *arg)
{
int i;
SDLTest_AssertPass("Call to SDL_StringToGUID");
for (i = 0; i < NUM_TEST_GUIDS; ++i) {
Uint8 expected[16];
SDL_GUID guid;
upper_lower_to_bytestring(expected,
test_guids[i].upper, test_guids[i].lower);
guid = SDL_StringToGUID(test_guids[i].str);
SDLTest_AssertCheck(SDL_memcmp(expected, guid.data, 16) == 0, "GUID from string, GUID was: '%s'", test_guids[i].str);
}
return TEST_COMPLETED;
}
/**
* Check GUID-to-String conversion
*
* \sa SDL_GUIDToString
*/
static int
TestGUIDToString(void *arg)
{
int i;
SDLTest_AssertPass("Call to SDL_GUIDToString");
for (i = 0; i < NUM_TEST_GUIDS; ++i) {
char guid_str[33];
SDL_GUID guid;
upper_lower_to_bytestring(guid.data,
test_guids[i].upper, test_guids[i].lower);
SDL_GUIDToString(guid, guid_str, sizeof(guid_str));
SDLTest_AssertCheck(SDL_strcmp(guid_str, test_guids[i].str) == 0, "Checking whether strings match, expected %s, got %s\n", test_guids[i].str, guid_str);
}
return TEST_COMPLETED;
}
/* ================= Test References ================== */
/* GUID routine test cases */
static const SDLTest_TestCaseReference guidTest1 = {
(SDLTest_TestCaseFp)TestStringToGUID, "TestStringToGUID", "Call to SDL_StringToGUID", TEST_ENABLED
};
static const SDLTest_TestCaseReference guidTest2 = {
(SDLTest_TestCaseFp)TestGUIDToString, "TestGUIDToString", "Call to SDL_GUIDToString", TEST_ENABLED
};
/* Sequence of GUID routine test cases */
static const SDLTest_TestCaseReference *guidTests[] = {
&guidTest1,
&guidTest2,
NULL
};
/* GUID routine test suite (global) */
SDLTest_TestSuiteReference guidTestSuite = {
"GUID",
NULL,
guidTests,
NULL
};